Sfoglia per Autore
A STRUCTURAL INVESTIGATION ON EVAPORATED SMALL CLUSTERS OF CR BY SURFACE ELECTRON-ENERGY LOSS FINE-STRUCTURE SPECTROSCOPY
1990-01-01 Decrescenzi, M; Diamanti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S.
EXTENDED FINE-AUGER-STRUCTURE INVESTIGATION OF DISCONTINUOUS CHROMIUM FILMS
1990-01-01 Decrescenzi, M; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
STRUCTURAL STUDY OF THIN-FILMS BY EXTENDED ENERGY-LOSS FINE-STRUCTURE SPECTROSCOPY
1990-01-01 Decrescenzi, M; Motta, N; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
STRUCTURAL CHARACTERIZATION OF SUPPORTED CHROMIUM CLUSTERS BY EXTENDED ENERGY-LOSS FINE-STRUCTURE
1990-01-01 Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S; Diociaiuti, M; Paoletti, L.
ELECTRONIC-STRUCTURE OF CR-CLUSTERS ON GRAPHITE
1991-01-01 Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M.
STRUCTURAL INVESTIGATION OF THE CR/SI INTERFACE
1991-01-01 Passacantando, Maurizio; Picozzi, P; Decrescenzi, M.; Lozzi, L; Santucci, Sandro
STRUCTURAL AND ELECTRONIC STUDIES OF CLEAN AND OXIDIZED THIN FE FILMS ON POLYCRYSTALLINE COPPER
1992-01-01 Dinardo, S; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Lozzi, Luca; Decrescenzi, M; Dendaas, H.
Extended energy loss fine structure technique: an analytical tool for surface and bulk characterization
1992-01-01 Decrescenzi, M; Davoli, I; Lozzi, Luca; Passacantando, Maurizio; Santucci, Sandro; Picozzi, P.
DETERMINATION OF STOICHIOMETRY OF SIOX THIN-FILMS USING AN AUGER PARAMETER
1992-01-01 Alfonsetti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
L2,3 EDGES OF CHROMIUM - COMPARISON BETWEEN ELECTRON-ENERGY LOSS SPECTRA IN TRANSMISSION AND REFLECTION MODE
1992-01-01 Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S; Diociaiuti, M; Decrescenzi, M.
EXTENDED ENERGY-LOSS FINE-STRUCTURE AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF CLEAN AND OXIDIZED FE THIN-FILMS ON POLYCRYSTALLINE CU
1992-01-01 Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M; Dendaas, H.
XPS, AES AND EELS STUDIES OF CR CLUSTERS ON GRAPHITE
1993-01-01 Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M.
3-BODY SIGNATURE OF THE BCC STRUCTURE IN EXTENDED ENERGY-LOSS SPECTRA OF CR METAL
1993-01-01 Filipponi, Adriano; Passacantando, Maurizio; Picozzi, P; Diociaiuti, M.; Lozzi, L; Santucci, Sandro
XPS STUDIES ON SIOX THIN-FILMS
1993-01-01 Alfonsetti, R; Lozzi, L; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
XPS STUDIES ON SIOX THIN-FILMS
1993-01-01 Alfonsetti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S.
1s shake-up x-ray photoelectron spectrum of Na in NaCl and other Na salts
1993-01-01 Filipponi, Adriano; S., DI NARDO; P., Picozzi; Passacantando, Maurizio; Lozzi, Luca; Santucci, Sandro
Structural investigation of gaseous, liquid, and solid Br2 by x-ray absorption
1993-01-01 Filipponi, Adriano; Ottaviano, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
EXTENDED FINE AUGER STRUCTURE INVESTIGATION OF DISCONTINUOUS COPPER-FILMS DEPOSITED ON GRAPHITE
1993-01-01 Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M.
UPS, XPS, AES studies of Te thin films deposited on Si(100) 2x1
1994-01-01 Nardo, Di; Lozzi, L.; Passacantando, Maurizio; Picozzi, P.; Santucci, S.
UPS, XPS, AES studies on Te thin films deposited on Si(100)2x1
1994-01-01 Di Nardo, S; Lozzi, Luca; Passacantando, M; Picozzi, P; Santucci, S.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
A STRUCTURAL INVESTIGATION ON EVAPORATED SMALL CLUSTERS OF CR BY SURFACE ELECTRON-ENERGY LOSS FINE-STRUCTURE SPECTROSCOPY | 1-gen-1990 | Decrescenzi, M; Diamanti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S. | |
EXTENDED FINE-AUGER-STRUCTURE INVESTIGATION OF DISCONTINUOUS CHROMIUM FILMS | 1-gen-1990 | Decrescenzi, M; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro | |
STRUCTURAL STUDY OF THIN-FILMS BY EXTENDED ENERGY-LOSS FINE-STRUCTURE SPECTROSCOPY | 1-gen-1990 | Decrescenzi, M; Motta, N; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro | |
STRUCTURAL CHARACTERIZATION OF SUPPORTED CHROMIUM CLUSTERS BY EXTENDED ENERGY-LOSS FINE-STRUCTURE | 1-gen-1990 | Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S; Diociaiuti, M; Paoletti, L. | |
ELECTRONIC-STRUCTURE OF CR-CLUSTERS ON GRAPHITE | 1-gen-1991 | Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M. | |
STRUCTURAL INVESTIGATION OF THE CR/SI INTERFACE | 1-gen-1991 | Passacantando, Maurizio; Picozzi, P; Decrescenzi, M.; Lozzi, L; Santucci, Sandro | |
STRUCTURAL AND ELECTRONIC STUDIES OF CLEAN AND OXIDIZED THIN FE FILMS ON POLYCRYSTALLINE COPPER | 1-gen-1992 | Dinardo, S; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Lozzi, Luca; Decrescenzi, M; Dendaas, H. | |
Extended energy loss fine structure technique: an analytical tool for surface and bulk characterization | 1-gen-1992 | Decrescenzi, M; Davoli, I; Lozzi, Luca; Passacantando, Maurizio; Santucci, Sandro; Picozzi, P. | |
DETERMINATION OF STOICHIOMETRY OF SIOX THIN-FILMS USING AN AUGER PARAMETER | 1-gen-1992 | Alfonsetti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro | |
L2,3 EDGES OF CHROMIUM - COMPARISON BETWEEN ELECTRON-ENERGY LOSS SPECTRA IN TRANSMISSION AND REFLECTION MODE | 1-gen-1992 | Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S; Diociaiuti, M; Decrescenzi, M. | |
EXTENDED ENERGY-LOSS FINE-STRUCTURE AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF CLEAN AND OXIDIZED FE THIN-FILMS ON POLYCRYSTALLINE CU | 1-gen-1992 | Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M; Dendaas, H. | |
XPS, AES AND EELS STUDIES OF CR CLUSTERS ON GRAPHITE | 1-gen-1993 | Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M. | |
3-BODY SIGNATURE OF THE BCC STRUCTURE IN EXTENDED ENERGY-LOSS SPECTRA OF CR METAL | 1-gen-1993 | Filipponi, Adriano; Passacantando, Maurizio; Picozzi, P; Diociaiuti, M.; Lozzi, L; Santucci, Sandro | |
XPS STUDIES ON SIOX THIN-FILMS | 1-gen-1993 | Alfonsetti, R; Lozzi, L; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro | |
XPS STUDIES ON SIOX THIN-FILMS | 1-gen-1993 | Alfonsetti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S. | |
1s shake-up x-ray photoelectron spectrum of Na in NaCl and other Na salts | 1-gen-1993 | Filipponi, Adriano; S., DI NARDO; P., Picozzi; Passacantando, Maurizio; Lozzi, Luca; Santucci, Sandro | |
Structural investigation of gaseous, liquid, and solid Br2 by x-ray absorption | 1-gen-1993 | Filipponi, Adriano; Ottaviano, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro | |
EXTENDED FINE AUGER STRUCTURE INVESTIGATION OF DISCONTINUOUS COPPER-FILMS DEPOSITED ON GRAPHITE | 1-gen-1993 | Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M. | |
UPS, XPS, AES studies of Te thin films deposited on Si(100) 2x1 | 1-gen-1994 | Nardo, Di; Lozzi, L.; Passacantando, Maurizio; Picozzi, P.; Santucci, S. | |
UPS, XPS, AES studies on Te thin films deposited on Si(100)2x1 | 1-gen-1994 | Di Nardo, S; Lozzi, Luca; Passacantando, M; Picozzi, P; Santucci, S. |
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