This paper uses a de-embedding procedure, based on measured and numerically computed S-parameters, to obtain the characterization of portions of a structure difficult to obtain by direct measurements. The results are validated by measurements and independent calculations.
Titolo: | De-embedding procedure based on computed/measured data set for PCB structures characterization |
Autori: | |
Data di pubblicazione: | 2004 |
Rivista: | |
Abstract: | This paper uses a de-embedding procedure, based on measured and numerically computed S-parameters, to obtain the characterization of portions of a structure difficult to obtain by direct measurements. The results are validated by measurements and independent calculations. |
Handle: | http://hdl.handle.net/11697/10908 |
Appare nelle tipologie: | 1.1 Articolo in rivista |
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