Applications of FSV to EMC and SI data

This paper is concerned with the usability of the feature selective validation (FSV) method for comparing validation data. It addresses how it can help in the validation process and how the resulting validation data can be interpreted. It does this by considering two different case studies. The first considers two approaches to modeling electric fields in an equipment rack, and the second compares a Spice model for coupled circuit boards with a reference full wave model. The paper concludes that while the single value summary metrics are helpful to give an overall level of agreement, the detailed point-by-point information is very helpful when considering how to improve the models or measurements involved.