The electronic and structural properties of very thin iron films deposited in ultrahigh vacuum on polycrystalline copper have been studied by x-ray photoemission and Auger spectroscopies and the extended energy loss fine structure technique beyond the L2,3 edges of iron. Shifts in both core level and valence band binding energies together with a decrease in nearest-neighbour distance are consistent with a cluster growth picture. Successive oxidation and thermal treatments have shown a selectivity towards oxidation of the iron deposits with respect to the copper substrate and a restoration of the cleanness of the iron deposit after thermal treatment.
EXTENDED ENERGY-LOSS FINE-STRUCTURE AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF CLEAN AND OXIDIZED FE THIN-FILMS ON POLYCRYSTALLINE CU
LOZZI, Luca;PASSACANTANDO, MAURIZIO;SANTUCCI, Sandro;
1992-01-01
Abstract
The electronic and structural properties of very thin iron films deposited in ultrahigh vacuum on polycrystalline copper have been studied by x-ray photoemission and Auger spectroscopies and the extended energy loss fine structure technique beyond the L2,3 edges of iron. Shifts in both core level and valence band binding energies together with a decrease in nearest-neighbour distance are consistent with a cluster growth picture. Successive oxidation and thermal treatments have shown a selectivity towards oxidation of the iron deposits with respect to the copper substrate and a restoration of the cleanness of the iron deposit after thermal treatment.Pubblicazioni consigliate
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