An analytical method for determining the diffraction points in ray tracing is proposed. The general case of diffraction by oblique straight wedges in 3D is considered. The sampling problem is solved for a first order diffracted ray congruence in such a way to provide a suitable sampling of the rays diffracted by a second wedge. The method can be extended to the sampling of higher-order diffracted rays. An example is provided for a couple of orthogonal edges lighted by a point source.
A method for multiple diffracted ray sampling in forward ray tracing
DI GIAMPAOLO, EMIDIO;
2001-01-01
Abstract
An analytical method for determining the diffraction points in ray tracing is proposed. The general case of diffraction by oblique straight wedges in 3D is considered. The sampling problem is solved for a first order diffracted ray congruence in such a way to provide a suitable sampling of the rays diffracted by a second wedge. The method can be extended to the sampling of higher-order diffracted rays. An example is provided for a couple of orthogonal edges lighted by a point source.File in questo prodotto:
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