We have applied the total photoelectron yield method on ferritic-iron surface to measure the EXAFS of the natural oxide layer at the Frascati Synchrotron Radiation facility (PULS). We have found that the oxide contribution to the spectrum is relevant at low values of photoelectron wavevector k. The FeO distance d = 2.04 A has been determined. The effective sampling depth of the total yield mode at ≅ 7 keV has been found. The energy dependence of the sampling depth of total yield in the X-ray range from 1.5 to 9 keV is found to increase with photoenergy.

Sexafs study of the natural oxide on iron surface detected by total photoelectron yield

PALLADINO, Libero
1982-01-01

Abstract

We have applied the total photoelectron yield method on ferritic-iron surface to measure the EXAFS of the natural oxide layer at the Frascati Synchrotron Radiation facility (PULS). We have found that the oxide contribution to the spectrum is relevant at low values of photoelectron wavevector k. The FeO distance d = 2.04 A has been determined. The effective sampling depth of the total yield mode at ≅ 7 keV has been found. The energy dependence of the sampling depth of total yield in the X-ray range from 1.5 to 9 keV is found to increase with photoenergy.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11697/6045
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