Localization of Defects Via Residence Time Measures

We show that residence time measure can be used to identify the geometrical and transmission properties of a defect along a path. The model we study is based on a one--dimensional simple random walk. The sites of the lattice are regular, i.e., the jumping probabilities are the same in each site, except for a site, called emph{defect}, where the jumping probabilities are different. At each side of the lattice an absorbing site is present. We show that by measuring the fraction of particles crossing the channel and/or the typical time they need to cross it, it is possible to identify the main features of the lattice and of the defect site, namely, the jumping probabilities at regular and at the defect sites and the position of the defect in the lattice.