We report the field emission characterization of graphene flakes deposited on SiO2/Si substrates. Electrical measurements are performed inside a scanning electron microscope provided of nano-manipulated metallic probes exploited as electrodes either to contact the flakes or as anode to collect electrons in field emission configuration. We demonstrate that local electric field as high as few hundreds V/µm allows to extract a current from the top of the flake. We also demonstrate a horizontal field emission device in which the electrons are extracted from the edge of the flake.

Field Emission from Graphene Layers

Passacantando M.;
2023

Abstract

We report the field emission characterization of graphene flakes deposited on SiO2/Si substrates. Electrical measurements are performed inside a scanning electron microscope provided of nano-manipulated metallic probes exploited as electrodes either to contact the flakes or as anode to collect electrons in field emission configuration. We demonstrate that local electric field as high as few hundreds V/µm allows to extract a current from the top of the flake. We also demonstrate a horizontal field emission device in which the electrons are extracted from the edge of the flake.
978-3-031-08135-4
978-3-031-08136-1
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11697/192960
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