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The effects of silicon nitride and silicon oxynitride intermediate layers on the properties of tantalum pentoxide films on silicon: X-ray photoelectron spectroscopy, X-ray reflectivity and capacitance-voltage studies
2003-01-01 Passacantando, Maurizio; Jolly, F; Lozzi, Luca; Salerni, V; Picozzi, P; Santucci, S; Corsi, C; Zintu, D.
The influence of air and vacuum thermal treatments on the NO2 gas sensitivity of WO3 thin films prepared by thermal evaporation
2001-01-01 Lozzi, Luca; Ottaviano, Luca; Passacantando, Maurizio; Santucci, S; Cantalini, Carlo
THE INTERACTION OF CU(100)-FE SURFACES WITH OXYGEN STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY
1994-01-01 Dendaas, H; Passacantando, Maurizio; Picozzi, P.; Santucci, Sandro; Lozzi, Luca
The role of physical and operational parameters in photocatalysis by N-doped TiO2 sol-gel thin films
2014-01-01 Hadas, Mamane; Inna, Horovitz; Lozzi, Luca; Daniela Di, Camillo; Dror, Avisar
THE USE OF THE AUGER PARAMETER IN THE CHARACTERIZATION OF SOME SILICON-COMPOUNDS
1995-01-01 Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S.
Thermally induced phase transition in crystalline lead phthalocyanine films investigated by XRD and atomic force microscopy
1998-01-01 Ottaviano, Luca; Lozzi, Luca; Phani, Ar; Ciattoni, A; Santucci, S; Di Nardo, S.
Thin and ultra-thin films of nickel phthalocyanine grown on highly oriented pyrolitic graphite: An XPS, UHV-AFM and air tapping-mode AFM study
1997-01-01 Ottaviano, L; Dinardo, S; Passacantando, Maurizio; Picozzi, P; Lozzi, L; Santucci, Sandro
UPS AND XPS STUDIES OF CU CLUSTERS ON GRAPHITE
1994-01-01 Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M.
UPS, XPS, AES studies of Te thin films deposited on Si(100) 2x1
1994-01-01 Nardo, Di; Lozzi, L.; Passacantando, Maurizio; Picozzi, P.; Santucci, S.
UPS, XPS, AES studies on Te thin films deposited on Si(100)2x1
1994-01-01 Di Nardo, S; Lozzi, Luca; Passacantando, M; Picozzi, P; Santucci, S.
Legenda icone
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 226
- 1 Contributo su Rivista::1.1 Arti... 226
Data di pubblicazione
- 2020 - 2024 19
- 2010 - 2019 26
- 2000 - 2009 90
- 1990 - 1999 85
- 1986 - 1989 6
Editore
- Cambridge University Press: 2011 1
Rivista
- SURFACE SCIENCE 26
- JOURNAL OF VACUUM SCIENCE & TECHN... 17
- THIN SOLID FILMS 15
- JOURNAL OF ELECTRON SPECTROSCOPY ... 10
- JOURNAL OF NON-CRYSTALLINE SOLIDS 9
- SURFACE AND INTERFACE ANALYSIS 8
- JOURNAL OF VACUUM SCIENCE & TECHN... 7
- PHYSICAL REVIEW. B, CONDENSED MATTER 7
- SENSORS AND ACTUATORS. B, CHEMICAL 7
- SOLID STATE COMMUNICATIONS 7
Keyword
- N-doped TiO2 5
- carbon nanotubes 2
- Coatings and Films 2
- Condensed Matter Physics 2
- DFT 2
- Electronic 2
- Gas phase 2
- nanofibers 2
- Optical and Magnetic Materials 2
- photoconductivity 2
Lingua
- eng 208
Accesso al fulltext
- no fulltext 205
- reserved 8
- open 7
- restricted 6