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Titolo Data di pubblicazione Autore(i) File
XI. Dewey e la democrazia 1-gen-2022 D'Arcangeli, M. A.
XIII National Congress SISMES 1-gen-2023 Bonavolonta', V.; Cardinali, L.; Falcioni, L.; Ferrari, D.; Baldari, C.; Guidetti, L.; Gallotta, M. C.
An XML Definition Language to Support Scenario Based Requirements Engineering 1-gen-2003 Orefice, Sergio; DELLA PENNA, Giuseppe; Laurenzi, A; Intrigila, B.
XML technologies for the Omaha System: a data model, a Java tool and several case studies supporting home healthcare 1-gen-2009 Vittorini, Pierpaolo; Tarquinio, A; DI ORIO, Ferdinando
XPO1/CRM1-Selective Inhibitors of Nuclear Export (SINE) reduce tumor spreading and improve overall survival in preclinical models of prostate cancer (PCa) 1-gen-2014 Gravina, GIOVANNI LUCA; 4, ; Monica, Tortoreto2; Andrea, Mancini1; Alessandro, Addis2; DI CESARE, Ernesto; Andrea, Lenzi4; Yosef, Landesman5; Dilara, Mccauley5; Michael, Kauffman5; Sharon, Shacham5; Nadia, Zaffaroni2; Claudio, Festuccia
XPRIT: An XML-Based Tool to Translate UML Diagrams into Execution Graphs and Queueing Networks 1-gen-2004 Cortellessa, Vittorio; Michele, Gentile; Marco, Pizzuti
XPS analysis on SiO2 sol-gel thin films 1-gen-1995 Santucci, S.; Dinardo, S.; Lozzi, L.; Passacantando, Maurizio; Picozzi, P.
XPS and SEM studies of oxide reduction of germanium nanowires 1-gen-2010 Grossi, V; Ottaviano, Luca; Santucci, Sandro; Passacantando, Maurizio
XPS depth profiling studies of L-CVD SnO2 thin films 1-gen-2006 Kwoka, M; Ottaviano, Luca; Passacantando, Maurizio; Santucci, Sandro; Szuber, J.
XPS STUDIES ON SIOX THIN-FILMS 1-gen-1993 Alfonsetti, R; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, S.
XPS STUDIES ON SIOX THIN-FILMS 1-gen-1993 Alfonsetti, R; Lozzi, L; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
XPS study of air exposed copper phthalocyanine ultra-thin films deposited on Si(111) native substrates 1-gen-2008 Krzywiecki, M; Grzadziel, L; Ottaviano, L; Parisse, P; Santucci, Sandro; Szuber, J.
XPS study of graphene oxide reduction induced by (100) and (111)-oriented Si substrates 1-gen-2018 Priante, Fabio; Salim, Maan; Ottaviano, L.; Perrozzi, F.
XPS study of the FCuPc/SiO2 interface 1-gen-2003 Lozzi, Luca; Santucci, S.
XPS study of the surface chemistry of Ag-covered L-CVD SnO2 thin films 1-gen-2008 Kwoka, M.; Ottaviano, Luca; Passacantando, Maurizio; Czempik, G.; Santucci, Sandro; Szuber, J.
XPS study of the surface chemistry of L-CVD SnO2 thin films after oxidation 1-gen-2005 Kwoka, M; Ottaviano, Luca; Passacantando, Maurizio; Santucci, Sandro; Czempik, G; Szuber, J.
XPS, AES AND EELS STUDIES OF CR CLUSTERS ON GRAPHITE 1-gen-1993 Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro; Decrescenzi, M.
XPS, AES and leed studies of the interaction between the Si(100) 2x1 surface and cadmium deposited at room temperature 1-gen-1995 Santucci, S.; Dinardo, S.; Lozzi, L.; Passacantando, Maurizio; Picozzi, P.
XPS, LEED and AFM investigation of the Si(100) surface after the deposition and annealing of tellurium thin films 1-gen-1996 Santucci, Sandro; Dinardo, S; Lozzi, L; Passacantando, M; Picozzi, P.
XPS, TDS, and AFM studies of surface chemistry and morphology of Ag-covered L-CVD SnO2nanolayers 1-gen-2014 Kwoka, Monika; Ottaviano, Luca; Koscielniak, Piotr; Szuber, Jacek
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