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PRODUCTION AND CHARACTERIZATION OF MULTILAYER KCL-LIF THIN-FILMS ON GLASS 1-gen-1995 Somma, F; Ercoli, A; Santucci, Sandro; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P.
Investigation on the electronic structure of Fe deposited onto polycrystalline copper 1-gen-1996 Santucci, Sandro; Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P.
Influence of non-dipolar terms on the Cu L(2,3) and M(2,3) electron energy loss fine structure (EELFS) spectra in transmission and reflection mode 1-gen-1996 Diociaiuti, M; Lozzi, Luca; Passacantando, Maurizio; Santucci, S; Picozzi, P; Decrescenzi, M.
Microstructural effect on NO2 sensitivity of WO3 thin film gas sensors .1. Thin film devices, sensors and actuators 1-gen-1996 Sun, Ht; Cantalini, Carlo; Lozzi, Luca; Passacantando, Maurizio; Santucci, Sandro; Pelino, M.
XPS, LEED and AFM investigation of the Si(100) surface after the deposition and annealing of tellurium thin films 1-gen-1996 Santucci, Sandro; Dinardo, S; Lozzi, L; Passacantando, M; Picozzi, P.
Structural and optical properties of low energy electrons irradiated KCl:LiF multilayer films 1-gen-1996 Somma, F; Cremona, M; Montereali, Rm; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
Study by X-ray photoelectron spectroscopy and X-ray diffraction of the growth of TiN thin films obtained by nitridation of Ti layers 1-gen-1996 Santucci, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Alfonsetti, R; Diamanti, R; Moccia, G.
NO2 sensitivity of WO3 thin film obtained by high vacuum thermal evaporation 1-gen-1996 Cantalini, Carlo; Sun, Ht; Faccio, Marco; Santucci, S; Lozzi, Luca; Passacantando, Maurizio; Pelino, M
Cross-Sensitivity and stability of NO2 Sensors from WO3 Thin Film 1-gen-1996 Cantalini, Carlo; Pelino, M; Sun, Ht; Faccio, Marco; Santucci, S; Lozzi, Luca; Passacantando, Maurizio
Characterization and electrical properties of WO3 sensing thin films 1-gen-1997 Cantalini, Carlo; Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Pelino, M; Phani, Ar; Santucci, S.
PbPC growth on Si surfaces studied with XPS and various SPM techniques 1-gen-1997 Ottaviano, L; Lozzi, Luca; Dinardo, S; Passacantando, Maurizio; Santucci, Sandro
Controlled growth and microstructural evolution of WO3 thin films on SiO2 and Si3N4 substrates 1-gen-1997 Cantalini, Carlo; Phani, A. R.; Faccio, M.; Passacantando, M.; DI NARDO, S.; Santucci, S.; Pelino, M.
Compositional characterization of very thin SiO2/Si3N4/SiO2 stacked films by x-ray photoemission spectroscopy and time-of-flight secondary-ion mass spectroscopy techniques 1-gen-1997 Santucci, S.; Lozzi, L.; Ottaviano, Luca; Passacantando, Maurizio; Picozzi, P.; Moccia, G.; Alfonsetti, R.; DI GIACOMO, A.; Fiorani, AND P.
Compositional and electrical properties of SiO2/Si3N4/SiO2 stacked films grown onto silicon substrates and annealed in hydrogen 1-gen-1997 Santucci, Sandro; Alfonsetti, R; Digiacomo, A; Fiorani, P; Lozzi, Luca; Moccia, G; Ottaviano, L; Passacantando, Maurizio; Picozzi, P.
Structural and optical properties of alkali halide multilayer LiF:NaF films 1-gen-1997 Somma, F; Montereali, Rm; Santucci, Sandro; Lozzi, Luca; Passacantando, Maurizio; Cremona, M; Mauricio, Mhp; Nunes, Ra
X-ray photoelectron spectroscopy studies of silicon suboxides obtained by the sol-gel method 1-gen-1997 Cordeschi, E; Passacantando, Maurizio; Picozzi, P; Degliesposti, Lm; Lozzi, Luca; Santucci, Sandro
NiPC/Si(111)(7x7) studied with XPS, STM and tapping mode air AFM 1-gen-1997 Ottaviano, Luca; Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P; Santucci, Sandro
Visible and infrared photoluminescence of low-energy electron irradiated LiF:KCl thin films 1-gen-1997 Cremona, M; Grilli, A; Montereali, Rm; Passacantando, Maurizio; Raco, A; Somma, F.
Rectifying behavior of silicon-phthalocyanine junctions investigated with scanning tunneling microscopy spectroscopy 1-gen-1997 Ottaviano, L; Santucci, S; Dinardo, S; Lozzi, Luca; Passacantando, Maurizio; Picozzi, P.
Thin and ultra-thin films of nickel phthalocyanine grown on highly oriented pyrolitic graphite: An XPS, UHV-AFM and air tapping-mode AFM study 1-gen-1997 Ottaviano, L; Dinardo, S; Passacantando, Maurizio; Picozzi, P; Lozzi, L; Santucci, Sandro
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